Sitio web:
Jeol
Todos los productos de Jeol
Transmission Electron Microscopes (TEM)
Scanning Electron Microscopes (SEM)
Specimen Preparation Equipment (CP)
MultiBeam System (FIB)
Electron Probe Microanalyzer (EPMA)
Auger Microprobe (Auger)
Photoelectron Spectrometer (ESCA)
X-ray Fluorescence Spectrometer (XRF)
Nuclear Magnetic Resonance Spectrometer (NMR)
Software
Electron Spin Resonance Spectrometer (ESR)
ESR Peripheral Equipment
GC-MS
MALDI-TOFMS
MS Software
Clinical Chemistry Analyzer (CA)
Vaciar el comparador
Comparar hasta 10 productos